HOME > Presentation > Detail
Near-Surface Chemical Characterization Using Grazing Incidence X-ray Fluorescence.
(斜入射蛍光Ｘ線分析法による表面近傍の化学状態分析.)
Photon Factory Symposium. February 06, 1990-February 07, 1990.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-18 00:17:50 +0900 Updated at: 2017-07-10 17:09:37 +0900