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冷却型CCDカメラによる電子線回析強度測定法の開発とγ'(Ni3Ti)析出物の規則度測定への応用.
(Development of the Electron Diffraction Intersity Measurement by Using TEM with Cooled CCD Camera and Its Application to the Res)
日本金属学会. October 16, 1993-October 18, 1993.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:06:24 +0900 Updated at: 2017-07-10 17:25:19 +0900