HOME > Presentation > Detail材料評価法としてのTEM-EELS法の現状と理想(TEM-EELS for materials science, the ideal and the real)木本 浩司, 松井 良夫. 日本顕微鏡学会第47回シンポジウム. November 27, 2002-November 28, 2002. InvitedNIMS author(s)KIMOTO, KojiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:22:28 +0900 Updated at: 2024-03-05 11:39:35 +0900