HOME > Presentation > Detail(Multiple-probe Scanning Probe Microscope for Nanometer-and Micrometer-scale Transport Measurements on Nanomaterials)中山 知信. NIMS-NanoNextNL Joint Workshop on Nanomaterials for Global Chall. 2014. InvitedNIMS author(s)NAKAYAMA, TomonobuFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:13:06 +0900Updated at: 2024-03-05 11:45:02 +0900