HOME > Presentation > Detail(TEM Specimen Preparation of Nano-wires Grown on Various Substrates by Integrating Wedge-Polishing with Back-side FIB Milling)郭 行健, 中山 佳子, 長谷川 明, 古屋 一夫. 1st NIMS conference 2007. July 11, 2007-July 13, 2007.NIMS author(s)NAKAYAMA, YoshikoHASEGAWA, AkiraFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-01-08 03:54:48 +0900Updated at: 2017-07-10 20:04:40 +0900