GaP/Si(001) interface study by Photoelectron spectroscopy with varying photon energies in combination with Ar gas cluster ion beam sputtering

O. Romanyuk, I. Gordeev, O. Supplie, A. Pasazuk, R. G. Wilks, J. Bombsch, C. Hartmann, R. Garcia-Diez, UEDA, Shigenori, E. Ukraintsev, I. Bartos, J. Houdkova, P. Kleinschmidt, M. Bar, P. Jiricek, T. Hannappel.

3rd International Conference on Applied Surface Science. 2019年06月17日-2019年06月20日.