HOME > Presentation > Detail
MBE法によるYBC薄膜の評価.
(Characterization of YBC Thin Films Grown by MBE Method.)
応用物理学会. October 09, 1991-October 12, 1991.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:46:09 +0900 Updated at: 2017-07-10 17:11:54 +0900