HOME > Presentation > Detail
斜入射X線散乱法によるTIO2単結晶表面の研究
(Grazing incidence X-ray scattering study on Tio2 single crystal surface.)
2nd International conferencl on synchrotron Radiation in Materic. October 31, 1998-November 03, 1998.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-18 01:33:11 +0900 Updated at: 2017-07-10 17:50:59 +0900