HOME > Presentation > DetailGeometric and Electronic Structures of Electrochemically Li Inserted Si(111) Studied by Scanning Electron Microscopy, X-ray Diffraction, and Soft X-ray Emission Spectroscopy青木菜々, 近藤敏啓, 魚崎 浩平. NIMS Conference. July 14, 2015-July 16, 2015.NIMS author(s)UOSAKI, KoheiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:01:54 +0900Updated at: 2017-07-10 22:20:10 +0900