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硬X線光電子分光を用いたFe3-xMxO4(M=Mn,Zn)薄膜の電子構造評価
(Electronic structure of Fe3-xMxO4 thin films investigated by Hard X-ray photoemission spectroscopy)
第54回応用物理学関係連合講演会. March 27, 2007-March 30, 2007.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 05:31:27 +0900Updated at: 2017-07-10 19:51:12 +0900