HOME > 口頭発表 > 書誌詳細ブラッグ回折像を用いた高分解能電子顕微鏡の対物レンズ収差の高精度計測(Accurate Measurement of Lens Aberrations of High-Resolution TEM by using Bragg Diffracted Images)石塚 和夫, 木本 浩司, 三留 正則, 板東 義雄. 8th Asia-Pacific Conference on Electron Microscopy. 2004.NIMS著者木本 浩司三留 正則板東 義雄Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-01-08 04:03:48 +0900更新時刻: 2017-07-10 19:01:34 +0900