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単粒子測定法によるシリコンの充放電に伴う体積変化の考察
(Study for volume change of Si electrode by single particle measurement system)

西川 慶, 棟方裕一, 金村 聖志.
電気化学会第80回大会. March 29, 2013-March 31, 2013.

NIMS author(s)


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    Created at: 2017-01-08 05:27:48 +0900 Updated at: 2017-07-10 21:32:56 +0900

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