SAMURAI - NIMS Researchers Database

NIMS Award Symposium 2026

HOME > Presentation > Detail

化合物半導体のフェムト秒時間分解表面反射率のヘテロダイン法を用いた測定
(Femtosecond Time-resblved Measurement of Reflectivity of GaAs by Using OHD)

中村一隆, 丑田公規, 柴田裕康, 中村一隆, 丑田公規, 柴田裕康.
分光学会. May 20, 1997-May 21, 1997.

NIMS author(s)


    Fulltext and dataset(s) on Materials Data Repository (MDR)


      Created at: 2017-02-18 01:15:21 +0900 Updated at: 2017-07-10 17:41:53 +0900

      ▲ Go to the top of this page