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AES深さプロフィルにより研究された薄膜構造における金属／酸化物界面の熱安定性
(Thermal stability of metal/oxide interfaces in thin films structures studied with AES depth profiling)
7th Eupopean Conference on Applications of Surface and Interface. June 16, 1997-June 20, 1997.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-18 01:17:22 +0900 Updated at: 2017-07-10 17:43:01 +0900