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硬X線光電子分光法による自然酸化膜/BaSi2のバンドオフセット測定
(Measurement of valence-band offset at native oxide/BaSi2 interfaces using hard x-ray photoelectron spectroscopy)
第76回応用物理学会秋季学術講演会. September 13, 2015-September 16, 2015.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:09:21 +0900Updated at: 2018-06-05 13:47:43 +0900