SAMURAI - NIMS Researchers Database

HOME > Presentation > Detail

Characterization of Wide Band Gap Semiconductor Films and Crystals using Hard-x-ray XPS

The 11th International Conference of Pacific Rim Ceramic Societi. August 30, 2015-September 04, 2015.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2017-02-14 11:08:42 +0900Updated at: 2017-07-10 22:09:40 +0900

    ▲ Go to the top of this page