Band alignments at native oxide/BaSi2 and amorphous-Si/BaSi2 interfaces measured by hard x-ray photoelectron spectroscopy
43rd IEEE PVSC. 2016.
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Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2017-02-14 11:22:07 +0900更新時刻: 2017-07-10 22:20:46 +0900