HOME > Presentation > DetailCross-sectional high resolution transmission electron microscopy observation of Si(113)3x2 structure(Si(113)3x2構造の断面HRTEM観察)TAKEGUCHI, Masaki, TANAKA, Miyoko, 保田英洋, FURUYA, Kazuo. 19th European Conference on Surface Science. September 05, 2000-September 08, 2000.NIMS author(s)TAKEGUCHI, MasakiTANAKA, MiyokoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2022-09-05 11:03:12 +0900 Updated at: 2022-09-05 11:03:12 +0900