HOME > Presentation > Detail
イオン照射初期に形成されるSiの二次欠陥の高分解能電顕観察.
(High Resolution Electron Microscopy of Secondary Defects Induced in Si in the early Stage of Irradiation.)
日本金属学会. March 31, 1993-April 02, 1993.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-18 00:35:20 +0900 Updated at: 2017-07-10 17:19:29 +0900