HOME > Presentation > Detail硬X線光電子分光法による誘電体Fe:SrTiO3の電子構造評価(Characterization of electronic structure in dielectric Fe:SrTiO3 single crystals by using hard X-ray photoemission spectroscopy)廣瀬左京, 上田 茂典, 大橋 直樹. 第56回セラミックス基礎討論会. January 11, 2018-January 12, 2018.NIMS author(s)UEDA, ShigenoriOHASHI, NaokiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-11-21 23:09:05 +0900 Updated at: 2018-06-05 14:15:12 +0900