HOME > Presentation > DetailInGaN/GaN量子井戸構造におけるIn組成、格子歪および内部電界のマッピング(Mapping In concentration, strain and internal electric field in InGaN/GaN quantum well structure)竹口 雅樹, M.R.McCartney, David Smith. 第51回応用物理学関係連合学術講演会. March 28, 2004-March 31, 2004.NIMS author(s)TAKEGUCHI, MasakiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:30:57 +0900 Updated at: 2017-07-10 18:57:47 +0900