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環境半導体BaSi2の高圧物性
(High-pressure X-ray diffraction study of BaSi2)
日本物理学会. March 24, 2005-March 27, 2005.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 04:01:57 +0900Updated at: 2017-07-10 19:17:21 +0900