HOME > Presentation > Detail(Nanometer-scale characterization of semiconductor quantum structures by STM light emission)鶴岡 徹. Symposium on Surface Physics 2005. January 26, 2005-January 29, 2005.NIMS author(s)TSURUOKA, TohruFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-25 00:52:14 +0900 Updated at: 2017-07-10 19:15:28 +0900