HOME > Presentation > Detail(Influence of Electric Field near Surface on Characteristic X-ray Emissionfrom Al2O3 Targets Bombarded with 30 keV Ga+ Ions)Jiancun RAO, 長谷川 明, Renchao CHE, 竹口 雅樹, 古屋 一夫. International Symposium on Surface Science and Nanotechnology. 2005.NIMS author(s)HASEGAWA, AkiraTAKEGUCHI, MasakiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-25 01:04:46 +0900Updated at: 2017-07-10 19:28:54 +0900