HOME > Presentation > Detail
Multiprobe Scanning Probe Microscopes for Electrical Conductivity Measurements of Low-dimensional Nanostructures
PCSI-34. January 14, 2007-January 18, 2007. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:16:30 +0900 Updated at: 2024-03-05 11:41:22 +0900