HOME > Presentation > DetailForce measurement by atomic force microscopy with a molecular tip at low temperature川井 茂樹. 45th conf on the Physics & Chemistry of Surfaces & Interfaces. 2018. InvitedNIMS author(s)KAWAI, ShigekiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2018-02-15 22:07:28 +0900Updated at: 2024-03-05 12:20:33 +0900