HOME > Presentation > Detail Electron Channeling Contrast Imaging: A Powerful Technique to Quantitative Microstructure Characterization in the SEMIvan Gutierrez-Urrutia. 2nd East-Asia Microscopy Conference. November 24, 2015-November 27, 2015.NIMS author(s)GUTIERREZ URRUTIA, IvanFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-01-08 04:52:01 +0900Updated at: 2024-05-02 08:04:10 +0900