Integration of Wedge-Polishing and FIB Milling for the Cross-Sectional TEM Specimen Preparation of Nano-wires Grown on Various Substrates
日本顕微鏡学会第63回学術講演会. 2007.
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2017-02-14 11:46:42 +0900更新時刻: 2017-07-10 19:55:36 +0900