Electron holographic study of the effect of contact resistance of connected nanowires on resistivity measurement
5th International Symposium on Atomic Level Characterizations fo. 2005.
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2022-09-05 11:53:31 +0900更新時刻: 2022-09-05 11:53:31 +0900