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単粒子測定を用いたシリコン1粒子の初回充電反応解析
(Measurement of first charging reacion of one Si particle by single particle measurement technique)

表面技術協会第132回講演大会. September 09, 2015-September 10, 2015.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2017-02-14 11:43:28 +0900Updated at: 2017-07-10 22:12:03 +0900

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