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STEM-ADF像の定量計測による二次元材料の積層構造解析
(Stacking Structure Analysis of Two-dimensional Materials Using Quantitative Annular Dark-Field Imaging)
MI・計測合同シンポジウム. 2018-03-08.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2018-02-17 22:04:30 +0900 Updated at: 2018-06-05 14:17:47 +0900