(New Insights on Atomic Resolution Frequency Modulation Kelvin Probe Fo rce Microscopy Imaging of Semiconductors)
3rd Global COE Intl. Symposium: Electronic Devices Innovation. 2011. 招待講演
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2017-01-08 04:23:47 +0900更新時刻: 2024-03-05 11:43:46 +0900