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Ag/Ta2O5/Pt素子におけるフォーミングプロセスの活性化障壁測定
(Activation Barrier Measurement of the Forming Process for an Ag/Ta2O5/Pt Device)

棚橋直哉, 鶴岡 徹, 長谷川剛.
第78回応用物理学会 秋季学術講演会. September 05, 2017-September 08, 2017.

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Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2017-07-11 22:39:35 +0900Updated at: 2018-06-05 14:10:47 +0900

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