Structural Analysis of Electron-Beam-Irradiated C60 Single Crystal Films using High-Resolution Transmission Electron Microscopy and Electron Diffraction
The 18th International Microscopy Congress. 2014.
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2017-01-08 03:49:38 +0900更新時刻: 2017-07-10 22:07:39 +0900