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全反射HAXPESによるアモルファス酸化物半導体の 価電子帯直上欠陥の深さ方向分布
(Depth analysis of near-valence band maximum states in amorphous oxide semiconductor by total reflection HAXPES)
第65回応用物理学会春季学術講演会. March 17, 2018-March 20, 2018. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2018-01-19 22:07:51 +0900Updated at: 2024-03-05 12:20:31 +0900