HOME > 口頭発表 > 書誌詳細(Quantitative assessment of lower-voltage TEM performance using 3D Fourier transform of through-focus series)木本 浩司, 石塚 和夫. Frontiers of Electron Microscopy in Materials Science 2013. 2013.NIMS著者木本 浩司Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-14 11:19:27 +0900更新時刻: 2017-07-10 21:40:20 +0900