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X線散乱測定によるアモルファスBiOx, Bi2O3-GeO2の構造解析
(The structure of amorphous BiOx and Bi2O3-GeO2 revealed by total scattering measurements)

小原 真司, 尾原幸治, 紅野安彦, ビチコフ ユージン.
NIMS conference 2015. 2015.

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    Created at: 2017-01-08 05:11:18 +0900Updated at: 2017-07-10 22:10:30 +0900

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