HOME > Presentation > Detail
X線散乱測定によるアモルファスBiOx, Bi2O3-GeO2の構造解析
(The structure of amorphous BiOx and Bi2O3-GeO2 revealed by total scattering measurements)
NIMS conference 2015. July 14, 2015-July 16, 2015.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 05:11:18 +0900Updated at: 2017-07-10 22:10:30 +0900