HOME > 口頭発表 > 書誌詳細Development of a double-tilt stage-scanning sample holder for scanning confocal electron microscopy of single crystal samplesTAKEGUCHI, Masaki. The 2nd International Symposium on Advanced Microscopy and Theor. 2010.NIMS著者竹口 雅樹Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-09-05 12:51:23 +0900更新時刻: 2022-09-05 12:51:23 +0900