HOME > 口頭発表 > 書誌詳細(High spatial-resolution analysis using scanning transmission electron microscopy; limiting factors for realizing atomic resolution)木本 浩司. IBM-NIMS symposium on characterization and manipulation. 2010. 招待講演NIMS著者木本 浩司Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-01-08 03:38:28 +0900更新時刻: 2024-03-05 11:43:02 +0900