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導電性AFMを利用した単層WSe2の点欠陥識別
(Identifying point defects in monolayer WSe2 using conductive AFM)
第86回日本応用物理学会秋季学術講演会. September 07, 2025-September 10, 2025.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2025-09-23 03:12:51 +0900 Updated at: 2025-09-23 03:12:51 +0900