HOME > Presentation > Detail低加速イオンミリングによる超薄試料の作成(Ultra thin specimen fabricated by low voltage ion milling)三留 正則. 日本顕微鏡学会第67回学術講演会. May 16, 2011-May 18, 2011.NIMS author(s)MITOME, MasanoriFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:20:26 +0900Updated at: 2017-07-10 21:02:02 +0900