HOME > Presentation > Detail(Investigation of Electronic Properties for V0.99W0.01O2 Thin Films Using Hard X-ray Photoemission Spectroscopy)高見英史, 神吉輝夫, 上田 茂典, 小林 啓介, Nam-Goo Cha, 田中秀和. International Conference on Core Research and Enegineering Scien. 2010.NIMS author(s)UEDA, ShigenoriFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-01-08 03:34:41 +0900Updated at: 2017-07-10 21:03:42 +0900