HOME > Presentation > Detail
Scanning Tunneling Microscopy in Extreme Fields:Very Low Temperature and High Magnetic Field, and extreme high vacuum
(極低温・強磁場STMの開発)
1st International Symposium on Active Nano-Characterization and . November 11, 2003-November 14, 2003.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2022-09-05 11:26:02 +0900 Updated at: 2022-09-05 11:26:02 +0900