Surface band bending of widegap semiconductors probed by hard X-ray photoemission spectroscopy combined with X-ray total reflection
International Conference on the Science and Technology for Advanced Ceramics. 2024-02-29.
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2024-03-12 03:11:56 +0900更新時刻: 2024-03-12 03:11:56 +0900