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(Optical and electronic characterization of individual semiconductor nanostructures by STM light emission)

The 5th France-Japan Workshop on Nanomaterials. 2004.

NIMS著者


Materials Data Repository (MDR)上の本文・データセット


    作成時刻: 2017-02-25 00:49:10 +0900更新時刻: 2017-07-10 19:11:41 +0900

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