HOME > 口頭発表 > 書誌詳細Quantum-dot transport via deep levels in silicon tunnel field-effect transistors (TFETs)森山 悟士, 森貴洋, 大野圭司. ICDS2017, International Conference on Defects in Semiconductors. 2017.NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-08-22 22:07:26 +0900更新時刻: 2018-06-05 14:11:50 +0900