HOME > 口頭発表 > 書誌詳細In-situ TEM Observations of Growth and Characterization of Nano-sized Branched Structures on Insulator Substrates in an Electron-beam-induced Deposition ProcessHASEGAWA, Akira. The 16th International Congress on Electron Microscopy. 2006年09月03日-2006年09月08日.NIMS著者長谷川 明Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-09-05 11:51:53 +0900更新時刻: 2022-09-05 11:51:53 +0900