In-situ TEM Observations of Growth and Characterization of Nano-sized Branched Structures on Insulator Substrates in an Electron-beam-induced Deposition Process
The 16th International Congress on Electron Microscopy. 2006年09月03日-2006年09月08日.
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Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2022-09-05 11:51:53 +0900 更新時刻: 2022-09-05 11:51:53 +0900