HOME > その他の文献 > 書誌詳細Measurement of lattice distortion near the SiO2/Si interface by using modulation of the crystal-truncation-rod scattering under YASHIRO, Wataru, 隅谷和嗣, MIKI, Kazushi, 依田芳卓, 高橋敏男. Spring-8 User Experiment Report No.9 (2002A) 9 71. 2002.NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2020-11-20 10:44:11 +0900 更新時刻: 2020-11-20 10:44:11 +0900
