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Thermoelectric Properties and its measuring　method of Mg2Si0.5Sn0.5 Semiconductor

ISODA, Yukihiro.
Proceedings of ICICN 2013 9999-1-9999-4. 2013.

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      Created at: 2022-09-05 14:13:10 +0900 Updated at: 2022-09-05 14:13:10 +0900

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