HOME > その他の文献 > 書誌詳細Depth-controled measurement of mesoscopic-range strain field under the SiO2/Si interface by using the phase-sensitive X-ray diffYASHIRO, Wataru, MIKI, Kazushi, 依田芳卓, 高橋敏男. SPring-8 User Experiment Report 12 60-60. 2004.NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2020-11-20 10:42:55 +0900 更新時刻: 2020-11-20 10:42:55 +0900
